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Spectrum analyzer and spectrum analysis method

机译:频谱分析仪及频谱分析方法

摘要

A spectrum analysis apparatus includes an electromagnetic wave source configured to emit an electromagnetic wave having a wavelength from 0.1 mm to 10 mm, a spectrometer a detecting section configured to detect an emitted electromagnetic wave that exits from the measurement object, the wave being transmitted through or reflected by the measurement object, and to generate a detection signal; and an analyzing section configured to analyze the detection signal. The analyzing section has a noise eliminating unit configured to generate a noise eliminated signal by eliminating from the detection signal a round-trip electromagnetic wave having reciprocated twice or more inside the measurement object and then emitted from the measurement object, in the emitted electromagnetic wave. Furthermore, the analyzing section is configured to generate a transmission or reflection spectrum that is a corrected detection signal by using the noise eliminated signal.
机译:光谱分析装置包括:电磁波源,被配置为发射波长为0.1mm至10mm的电磁波;光谱仪;检测部,被配置为检测从测量对象出射的电磁波,该电磁波通过或通过被测量对象反射,并产生检测信号;分析部分,被配置为分析检测信号。分析部具有噪声消除单元,该噪声消除单元被配置为通过从检测信号中消除在所发射的电磁波中在测量对象内部往复两次或更多次然后从测量对象发射的往返电磁波来产生噪声消除信号。此外,分析部被配置为通过使用噪声消除信号来生成作为校正后的检测信号的透射或反射光谱。

著录项

  • 公开/公告号JP6524125B2

    专利类型

  • 公开/公告日2019-06-05

    原文格式PDF

  • 申请/专利权人 シャープ株式会社;

    申请/专利号JP20170024136

  • 发明设计人 北澤 田鶴子;

    申请日2017-02-13

  • 分类号G01N21/3581;

  • 国家 JP

  • 入库时间 2022-08-21 12:19:01

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