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Test and measurement system, differential logic probe, single ended logic probe and method for operating a test and measurement system
Test and measurement system, differential logic probe, single ended logic probe and method for operating a test and measurement system
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机译:测试和测量系统,差分逻辑探头,单端逻辑探头以及用于运行测试和测量系统的方法
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摘要
A test and measurement system for testing a device under test comprises a logic probe with a first probe tip for contacting the device under test, a logic receiver unit connected to the first probe tip for receiving a digital signal from the device under test via the first probe tip, and a DC voltage measuring unit connected to the first probe tip for measuring a DC voltage at the device under test via the first probe tip.
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