Method of testing the resistance of a circuit to a side channel analysis of second order or more

摘要

A test method of a circuit, comprising, acquiring value sets including values of a physical quantity or of logic signals, linked to the activity of a circuit to be tested when the circuit executes an operation of an operation set of distinct cryptographic operations applied to a same secret data, selecting at least two subsets of values in each value set, for each value set and each value subset, counting occurrence numbers of values of the subset, for each value set, forming all possible n-tuples associating together one of the occurrence numbers of each value subset of the value set, and computing a combined occurrence number for each n-tuple of the value set, to form an occurrence number set for the value set, and analyzing the occurrence number sets to determine the part of the secret data.