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Systems and methods for determining dielectric constant or resistivity from electromagnetic propagation measurement using contraction mapping
Systems and methods for determining dielectric constant or resistivity from electromagnetic propagation measurement using contraction mapping
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机译:使用收缩映射从电磁传播测量中确定介电常数或电阻率的系统和方法
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摘要
Identifying the dielectric constant and/or the electrical resistivity of part of a geological formation may reveal useful characteristics of the geological formation. This disclosure provides methods, systems, and machine-readable media to determine dielectric constant or electrical resistivity, or both, using contraction mapping. Specifically, contraction mapping may be used with a function of wavenumber k to iteratively solve for values of dielectric constant and electrical resistivity until convergence is achieved. This may allow for convergence to a solution without computing partial derivatives and/or with fewer iterations than previous techniques.
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