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Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope

机译:使用高分辨率激光扫描显微镜的方法和高分辨率激光扫描显微镜

摘要

A high resolution laser scanning microscope has beam shaping elements configured to shape a beam of fluorescence inhibiting light which is directed into a back aperture of an objective connected to form an intensity minimum delimited by intensity maxima of the fluorescence inhibiting light in a focus of the objective. A plurality of optical elements including the objective and the beam shaping elements are arranged in a beam path of the beam to the focus. Using the microscope includes removing or exchanging or altering or adding at least one of the optical elements arranged in the beam path of the beam of fluorescence inhibiting light, and compensating a variation of polarization varying properties of the plurality of the optical elements, that is caused by removing or exchanging or altering or adding the at least one optical element, by adapting the beam shaping elements to the variation.
机译:高分辨率激光扫描显微镜具有光束整形元件,该光束整形元件被配置为成形被引导到物镜的后孔中的荧光抑制光束,该光束被连接以形成由物镜焦点处的荧光抑制光的强度最大值界定的强度最小值。 。包括物镜和光束整形元件的多个光学元件布置在光束到焦点的光束路径中。使用显微镜的步骤包括:去除,交换或改变或增加布置在荧光抑制光束的光路中的至少一个光学元件;以及补偿所引起的多个光学元件的偏振变化特性的变化。通过移除或交换或改变或添加至少一个光学元件,通过使光束成形元件适应变化。

著录项

  • 公开/公告号US10386621B2

    专利类型

  • 公开/公告日2019-08-20

    原文格式PDF

  • 申请/专利权人 ABBERIOR INSTRUMENTS GMBH;

    申请/专利号US201715413890

  • 申请日2017-01-24

  • 分类号G02B21;G01N21/64;G02B21/16;G02B27/58;

  • 国家 US

  • 入库时间 2022-08-21 12:15:50

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