Motherboard analysis device and method of analyzing motherboard using same

摘要

A method for analyzing a motherboard for detecting an abnormally heated element of the motherboard includes placing the motherboard in a sealable container and powering on the motherboard, adjusting a temperature inside the sealable container to a predetermined temperature/temperature range, capturing a first image of the motherboard under ultraviolet light, capturing a thermal image of the motherboard, calibrating a position of the first image and the thermal image, combining the calibrated first image and the calibrated thermal image into a second image, and carrying out differential and image binarization processing on the second image and a template image to identify an abnormally heated element of the motherboard. A motherboard analysis device is also provided.