首页> 外国专利> Optical sensor interrogation system a method of manufacturing the optical sensor interrogation system

Optical sensor interrogation system a method of manufacturing the optical sensor interrogation system

机译:光学传感器询问系统一种制造光学传感器询问系统的方法

摘要

An optical sensor interrogation system can have a light source arranged for emitting light; a first optical arrangement arranged for intercepting the light and to forward the light to an optical sensor and to receive light therefrom. The wavelength reference is adapted to provide a reference wavelength. The system can further have a second optical arrangement adapted to receive reflected light from the optical sensor, a lens system for transferring the light into a beam and a scanning assembly including a scanning unit and/or a diffractive optical element. The system can still further have a detector for receiving optical response from the scanning assembly and a data processing system. A method is used to manufacture an optical sensor interrogation system.
机译:光学传感器询问系统可以具有被布置用于发射光的光源。第一光学装置布置成用于拦截光并将光转发到光学传感器并从其接收光。波长参考适于提供参考波长。该系统可以进一步具有第二光学装置,该第二光学装置适于接收来自光学传感器的反射光,用于将光传输到光束中的透镜系统,以及包括扫描单元和/或衍射光学元件的扫描组件。该系统还可以具有用于从扫描组件接收光学响应的​​检测器和数据处理系统。一种方法用于制造光学传感器询问系统。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号