首页> 外国专利> Defect detection method for monolithic separation membrane structures, repair method, and monolithic separation membrane structures

Defect detection method for monolithic separation membrane structures, repair method, and monolithic separation membrane structures

机译:整体分离膜结构的缺陷检测方法,修复方法和整体分离膜结构

摘要

Each cell is pressurized with gas from outside of the cell, the amount of permeation of the gas permeated into each cell is measured, and a cell having the amount of permeation greater than (average value of all cells+A) (wherein A is a predetermined value of σ to 6σ, where σ is the standard deviation) is considered to be defective. Alternatively, pressure is reduced for each cell, the degree of vacuum in each cell is measured, and a cell having the degree of vacuum worse than (average value of all cells+A) is considered to be defective. Then, a polymer compound is poured into the defective cells of the monolithic separation membrane structure and cured so that the defective cells are sealed. Alternatively, the polymer compound formed in advance as the sealing member is inserted into the defective cells to seal the defective cells.
机译:用来自电池外部的气体对每个电池加压,测量渗透到每个电池中的气体的渗透量,然后测量一个具有大于(所有电池的平均值+ A)(其中A是σ到6σ的预定值(其中σ是标准偏差)被认为是有缺陷的。可替代地,降低每个单元的压力,测量每个单元中的真空度,并且真空度比(所有单元的平均值+ A)差的单元被认为是有缺陷的。然后,将高分子化合物倒入整体式分离膜结构的缺陷单元中并固化,以密封缺陷单元。可替代地,预先将作为密封构件形成的高分子化合物插入缺陷单元中以密封缺陷单元。

著录项

  • 公开/公告号US10232318B2

    专利类型

  • 公开/公告日2019-03-19

    原文格式PDF

  • 申请/专利权人 NGK INSULATORS LTD.;

    申请/专利号US201514661319

  • 申请日2015-03-18

  • 分类号B32B33/00;B29C73/00;B32B43/00;B29C65/00;B32B37/00;B01D39/00;B01D41/00;B01D45/00;B01D46/00;B01D49/00;B01D50/00;B01D51/00;B01D59/50;F01N3/00;F01N3/02;B01D65/10;B01D63/06;B01D65/00;B01D69/02;B01D71/02;B29C73/02;B29C73/06;G01N15/08;G01M3/32;G01M3/34;B32B3/12;B29C70/76;B29K79/00;B29L31/14;

  • 国家 US

  • 入库时间 2022-08-21 12:13:59

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