Implementing over-masking removal in an on product multiple input signature register (OPMISR) test due to common channel mask scan registers (CMSR) loading

摘要

A method and circuit are provided for implementing enhanced scan data testing with over masking removal in an on product multiple input signature register plus (OPMISR+) test due to common Channel Mask Scan Registers (CMSRs) loading, and a design structure on which the subject circuit resides. An OPMISR plus satellite includes a multiple input signature register (MISR) for data collection and a plurality of associated scan channels. A common Channel Mask Scan Registers (CMSR) logic is used with the multiple input signature register (MISR). Unique CMSR data is loaded into at least one OPMISR plus satellite for implementing enhanced scan data testing. Scan pausing is used to reduce the amount of CMSR scan load data by loading the unique CMSR data only when needed.