首页> 外国专利> Method and device for recognizing and removing undesired artifacts in multichannel magnetic field or electric potential measurements

Method and device for recognizing and removing undesired artifacts in multichannel magnetic field or electric potential measurements

机译:用于识别和去除多通道磁场或电势测量中不希望的伪像的方法和设备

摘要

The present invention introduces a method, device and a computer program for removing artifacts present in individual channels of a multichannel measurement device. At first, a basis is generated defining an n-dimensional subspace of the N-dimensional signal space, where n is smaller than N, where using in the definition of the n-dimensional basis a physical model of a Signal Space Separation method, or a statistical model based on the statistics of recorded N-dimensional signals. Thereafter, a combined (n+m)-dimensional basis is formed by adding m signal vectors to the n-dimensional basis, each of these m signal vectors representing a signal present only in a single channel of the N-channel device. After this the recorded N-dimensional signal vector is decomposed into n+m components in the combined basis, and finally, components corresponding to the m added vectors in the combined basis are subtracted from the recorded N-dimensional signal vector.
机译:本发明介绍了一种用于去除存在于多通道测量设备的各个通道中的伪像的方法,设备和计算机程序。首先,生成定义N维信号空间的n维子空间的基础,其中n小于N,其中在n维基础的定义中使用信号空间分离方法的物理模型,或者基于记录的N维信号统计信息的统计模型。此后,通过将m个信号矢量加到n维基础上来形成组合的(n + m)维基础,这m个信号矢量中的每一个代表仅存在于N通道设备的单个通道中的信号。此后,将记录的N维信号向量在组合的基础上分解为n + m个分量,最后,从记录的N维信号向量中减去与组合基础上的m个相加的向量相对应的分量。

著录项

  • 公开/公告号US10307105B2

    专利类型

  • 公开/公告日2019-06-04

    原文格式PDF

  • 申请/专利权人 ELEKTA AB;

    申请/专利号US201314374365

  • 发明设计人 SAMU TAULU;MATTI KAJOLA;JUHA SIMOLA;

    申请日2013-01-24

  • 分类号H04B1/10;A61B5;A61B5/04;G01R33/035;G01R29/12;G01R33/02;G01R33/56;G06K9;A61B5/0476;A61B5/055;

  • 国家 US

  • 入库时间 2022-08-21 12:13:06

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