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Apparatus and methods for reducing mutual couplings in an antenna array

机译:用于减少天线阵列中的相互耦合的设备和方法

摘要

A device is presented for improving radio frequency (RF) and microwave array antenna performance. The device sits in the near field, the reactive region, of the antenna array with a pattern of electrically isolated rectangular, cross-shaped, ell, and/or similarly-shaped patches of flat metal or other conductor in a flat plane. The patches are segmented into smaller shapes no greater than 0.3 of a shortest wavelength of the nominal operating range of the antenna and/or the height of the plane is greater than 0.25 and/or less than 0.4 of the center frequency's wavelength. Mutual coupling S-parameters between neighboring elements are either simulated or measured, and the patch sizes or height are designed such that |S21Refl| is in a range of |S21Array|±20% of |S21Array|; and Phase(S21Refl) is in a range of Phase(S21Array)+180±30 degrees, where S21Array is an S-parameter between antenna two neighboring antenna elements measured or simulated without the device, where S21ADS is the same with the device, and S21Refl=S21ADS−S21Array.
机译:提出了一种用于改善射频(RF)和微波阵列天线性能的设备。该装置位于天线阵列的近场,电抗区域中,具有在平面中电隔离的矩形,十字形,椭圆形和/或类似形状的扁平金属或其他导体的图案。贴片被分割成较小的形状,不大于天线标称工作范围的最短波长的0.3和/或平面的高度大于中心频率的波长的0.25和/或小于0.4。模拟或测量相邻元素之间的相互耦合S参数,并设计贴片大小或高度,使得| S 21 Refl |在| S 21 Array |的| S 21 Array |±20%范围内;相位(S 21 Refl )处于相位(S 21 Array )+ 180±30的范围内度,其中S 21 Array 是在没有设备的情况下测量或模拟的两个相邻天线元件之间的S参数,其中S 21 ADS 与设备相同,并且S 21 Refl = S 21 ADS − S 21 Array

著录项

  • 公开/公告号US10135133B2

    专利类型

  • 公开/公告日2018-11-20

    原文格式PDF

  • 申请/专利权人 THE CHINESE UNIVERSITY OF HONG KONG;

    申请/专利号US201715603758

  • 发明设计人 KE-LI WU;CHANGNING WEI;XIDE MEI;

    申请日2017-05-24

  • 分类号H01Q7/04;H01Q1/52;H01Q21/06;H01Q21/22;H01Q25;H04B5;H04B7/0413;

  • 国家 US

  • 入库时间 2022-08-21 12:10:11

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