首页> 外国专利> CRYSTALLINE QUANTITATIVE PHASE ANALYSIS DEVICE, CRYSTALLINE QUANTITATIVE PHASE ANALYSIS METHOD, AND CRYSTALLINE QUANTITATIVE PHASE ANALYSIS PROGRAM

CRYSTALLINE QUANTITATIVE PHASE ANALYSIS DEVICE, CRYSTALLINE QUANTITATIVE PHASE ANALYSIS METHOD, AND CRYSTALLINE QUANTITATIVE PHASE ANALYSIS PROGRAM

机译:结晶定量相分析装置,结晶定量相分析方法和结晶定量相分析程序

摘要

Provided are an operation guide system, an operation guide method, and an operation guide program, which are capable of allowing a user to easily understand measurement of an X-ray optical system to be selected. A crystalline quantitative phase analysis device includes qualitative phase analysis result acquisition means for acquiring information on a plurality of crystalline phases contained in a sample, and weight ratio calculation means for calculating a weight ratio of the plurality of crystalline phases based on a sum of diffracted intensities corrected with respect to a Lorentz-polarization factor, a chemical formula weight, and a sum of squares of numbers of electrons belonging to each of atoms contained in a chemical formula unit, in the plurality of crystalline phases.
机译:提供一种操作指南系统,操作指南方法和操作指南程序,它们能够使用户容易地理解要选择的X射线光学系统的测量。晶体定量相分析装置包括:定性相分析结果获取装置,用于获取样本中包含的多个晶体相的信息;以及重量比计算装置,用于基于衍射强度的总和来计算多个晶体相的重量比。在多个结晶相中,对洛伦兹极化因子,化学式权重和属于化学式单元中包含的每个原子的电子数的平方和进行校正。

著录项

  • 公开/公告号US2018364183A1

    专利类型

  • 公开/公告日2018-12-20

    原文格式PDF

  • 申请/专利权人 RIGAKU CORPORATION;

    申请/专利号US201816111695

  • 发明设计人 HIDEO TORAYA;AKIHIRO HIMEDA;

    申请日2018-08-24

  • 分类号G01N23/2055;G01N23/20025;G01N23/20058;G01N23/207;

  • 国家 US

  • 入库时间 2022-08-21 12:10:01

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