ACTIVE REAL-TIME CHARACTERIZATION SYSTEM UTILIZING BEAM SCANNING FOR SURFACE IMAGING

摘要

A system and method for providing active real-time characterization of an article under test. A first scan assembly moves an infrared light source and an first visible light source so that a beam of coherent infrared light and a first beam of visible light move across a surface of an article under test in a raster pattern. A second scan assembly moves a visible light camera, a visible light second harmonic generation camera, an infrared camera, an infrared second harmonic generation camera, and the sum-frequency camera so that each camera receives a respective predetermined return beam of light from the surface of the article under test. A processor receives signals from each camera and generates an image of mechanical properties of the surface of the article under test based on such signals.