首页> 外国专利> ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCELERATION DEVICE

ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCELERATION DEVICE

机译:超紧凑型质量分析装置和超紧凑型颗粒加速装置

摘要

A mass analyzer includes a main substrate, an upper substrate adhered to the main substrate, and a lower substrate. A mass analysis room (cavity) is formed in the main substrate and penetrates from an upper surface of the first main substrate to a lower surface of the first main substrate. A vertical direction (Z direction) to the main substrate by the upper substrate, both sides of the lower substrate, a travelling direction (X direction) of charged particles and a right angle to the Z direction by the main substrate, and both sides of a right-angled direction (Y to Z direction) and the X direction by a side surface of the main substrate are surrounded. A central hole is open in the side plate of the main substrate that the charged particles enter. The charged particles enter the mass analysis room through the central hole formed in the first main substrate.
机译:质量分析器包括主基板,粘附到主基板的上基板和下基板。质量分析室(腔)形成在主基板中,并且从第一主基板的上表面穿透到第一主基板的下表面。上基板对主基板的垂直方向(Z方向),下基板的两侧,带电粒子的行进方向(X方向)和主基板相对于Z方向的直角以及主基板的侧面包围直角方向(Y至Z方向)和X方向。在带电粒子进入的主基板的侧板上开有中心孔。带电粒子通过形成在第一主基板上的中心孔进入质量分析室。

著录项

  • 公开/公告号US2019198306A1

    专利类型

  • 公开/公告日2019-06-27

    原文格式PDF

  • 申请/专利权人 TAKASHI HOSAKA;

    申请/专利号US201916274773

  • 发明设计人 TAKASHI HOSAKA;

    申请日2019-02-13

  • 分类号H01J49/06;H01J49/42;H01J49/38;H01J49/32;H01J49;H05H13/04;H05H9;H01J49/20;H05H7/04;H05H5/03;G01N27/62;H01J49/22;H05H7/22;

  • 国家 US

  • 入库时间 2022-08-21 12:07:45

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