FULL-FIELD STATISTICAL amp; CHARACTERIZING METHOD OF FLUID MICRO-EXPLORED STRAIN FOR ALLOY MICROSTRUCTURE

摘要

The invention relates to a full-field statistical & characterizing method of fluid micro-explored strain for alloy microstructure, comprising the following steps: a. grinding and polishing the surface of an alloy sample to mirror with no grinding defects, and then determining a to-be-measured area on the surface of the alloy sample; b. utilizing a white light interferometry 3D surface profiler to perform initial morphology measurement on the surface of an alloy sample; c. utilizing an isostatic pressing technology to obtain the microstructure deformation on the surface of the alloy sample, and then utilizing a white light interferometry 3D surface profiler to perform deformed morphology measurement on the surface of the alloy sample to obtain a changing spectrum of micro morphology of the microstructures on the surface of the alloy; and d. performing trans-scale and rapid quantitative statistical distribution characterization on the morphology change before and after isostatic pressing of the microstructures in the to-be-measured area of the alloy, so as to obtain a corresponding full-field metallography. In the present invention, the sample pretreatment is simple, the analysis speed is rapid, the scanning area is large, and the requirement of high throughput trans-scale analysis can be satisfied, so as to instruct the extraction of the material metallography feature unit.