Apparatus and method for simultaneous three-dimensional measuring of surfaces with multiple wavelengths

摘要

the invention relates to a device for the three-dimensional measurement of an object and includes a projektionsanordnung for projecting a pattern on a surface using electromagnetic radiationthe at least two different wavelengths or wavelength ranges in at least two different; and a detektoranordnung to capture the projected pattern in at least two different wavelengths or at least two different respective wavelengths from d in at least two different wavelengths.the invention relates to a method for the three-dimensional measurement to an object.