Terahertz inspection for additively manufactured materials

摘要

Apparatuses (40, 50) and systems comprising an additive manufacturing device (43) and an associated terahertz inspection device (12) for inspecting additively deposited layers (13a, 14, 15) in real time during or immediately following material deposition and parts made and inspected by the apparatuses (40, 50) and systems and their associated methods are disclosed herein.