METHOD FOR QUANTIFICATION OF PURITY OF SUB-VISIBLE PARTICLE SAMPLES.

摘要

The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image (100) of the sample. The sample contains objects (114). The objects (114) that have sizes being different from a size range of primary particles (120) and sizes being within the size range of primary particles (120) are enhanced. The objects (114) are detected as being primary particles (120) or debris (106). The detected primary particles (120) are excluded from the objects (114) so that the objects (114) contain debris (106) but no primary particles (120). A first total area (T1) of the detected debris (106) is measured. A second total area (T2) of the detected primary particles (120) is measured.