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SYSTEM FOR MEASURING AND MONITORING THE STRAIN ON OBJECTS STRESSED BY EXTERNAL FORCES

机译:用于测量和监视受外力作用的物体上的应变的系统

摘要

The present invention relates to a system for measuring and monitoring strains of a two- or tri-dimensional object, comprising at least one group of optical sensors to be applied on said object according to a predetermined geometric configuration, said at least one group comprising a number of sensors at least equal to the number of dimensions of said object, each of said optical sensors being provided within at least one fiber optic cable, an optical interrogator machine (M) for generating a light signal at a given frequency to be sent in said at least one fiber optic cable, and for receiving response signals from said optical sensors and for determining the wavelength's displacement of said optical sensors from their nominal value or calibration value determined at the time of fixing the fiber optic cable on the object itself when it is in rest condition, i.e. when said object is not subjected to any to any external force; and a computer (C) for calculating the object's strain with respect to at least one of two or three reference axes X, Y and Z; said computer (C) being connectable to said interrogator machine (M) and receiving data concerning the displacement's wavelength of each of said optical sensors with respect to their calibration values.
机译:本发明涉及一种用于测量和监视二维或三维物体的应变的系统,该系统包括至少一组根据预定的几何构造施加在所述物体上的光学传感器,所述至少一组包括:至少等于所述物体的尺寸的数量的传感器的数量,每个所述光学传感器设置在至少一根光缆内,光学询问机(M),用于产生给定频率的光信号以发送给所述至少一根光缆,用于接收来自所述光传感器的响应信号,以及根据将光缆固定在物体本身时确定的标称值或标定值来确定所述光传感器的波长位移处于静止状态,即当所述物体未受到任何外力时;计算机(C),用于计算相对于两个或三个参考轴X,Y和Z中至少一个的物体的应变;所述计算机(C)可连接至所述询问机(M),并接收关于每个所述光学传感器相对于其校准值的位移波长的数据。

著录项

  • 公开/公告号PT2583076T

    专利类型

  • 公开/公告日2019-04-02

    原文格式PDF

  • 申请/专利权人 PAOLO PERSI DEL MARMO;

    申请/专利号PT20110740730T

  • 发明设计人 PERSI DEL MARMO PAOLO;

    申请日2011-06-16

  • 分类号G01M5;G01M11/08;

  • 国家 PT

  • 入库时间 2022-08-21 12:00:59

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