首页> 外国专利> X-RAY FLUORESCENCE ANALYZER SYSTEM AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS OF AN ELEMENT OF INTEREST IN SLURRY

X-RAY FLUORESCENCE ANALYZER SYSTEM AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS OF AN ELEMENT OF INTEREST IN SLURRY

机译:X射线荧光分析仪系统和进行淤泥兴趣元素的X射线荧光分析的方法

摘要

X-ray fluorescence analyzer system comprises an X-ray tube (402),a slurry handling unit (201),and a crystal diffractor (601) located in a first direction from said slurry handling unit (201). The crystal diffractor (601) separates a predefined wavelength range from fluorescent X-rays (207) that propagate into said first direction, and directs the fluorescent X-rays in the separated predefined wavelength range to a radiation detector (602, 1605). The crystal diffractor (601) comprises a pyrolytic graphite crystal (603). Said predefined wavelength range comprises characteristic fluorescent radiation of a predefined element of interest with its atomic number Z between 41 and 60 the ends included. An energy resolution of said radiation detector (602, 1605) is better than 600 eV at the energy of said characteristic fluorescent radiation.
机译:X射线荧光分析仪系统包括X射线管(402),浆料处理单元(201)和从所述浆料处理单元(201)沿第一方向定位的晶体衍射器(601)。晶体衍射器(601)将预定波长范围与传播到所述第一方向的荧光X射线(207)分开,并将在分离的预定波长范围内的荧光X射线引导至辐射检测器(602、1605)。晶体衍射器(601)包括热解石墨晶体(603)。所述预定波长范围包括感兴趣的预定元素的特征荧光辐射,其原子序数Z在41和60之间,包括末端。在所述特征荧光辐射的能量下,所述辐射检测器(602、1605)的能量分辨率优于600eV。

著录项

  • 公开/公告号CA3097473A1

    专利类型

  • 公开/公告日2019-10-24

    原文格式PDF

  • 申请/专利权人 OUTOTEC (FINLAND) OY;

    申请/专利号CA20193097473

  • 发明设计人 SIPILA HEIKKI;PELLI ANTTI;KOSKINEN TOMMI;

    申请日2019-02-18

  • 分类号G01N23/207;C22B3/02;G01N23/223;G01T1/16;G21K1/06;

  • 国家 CA

  • 入库时间 2022-08-21 11:58:16

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