首页> 外国专利> FRONT COATED PLANE MIRROR-BASED STRUCTURED LIGHT PARAMETER CALIBRATION DEVICE AND METHOD

FRONT COATED PLANE MIRROR-BASED STRUCTURED LIGHT PARAMETER CALIBRATION DEVICE AND METHOD

机译:基于前涂层平面镜的结构化光参数校准装置及方法

摘要

Disclosed is a front coated plane mirror-based structured light parameter calibration device, comprising an area array camera, a word line laser, a front coated plane mirror, a plane glass target, and a white printing paper. Also disclosed is a front coated plane mirror-based structured light parameter calibration method, comprising: place the front coated plane mirror and the plane glass target in front of the camera; the camera simultaneously photographs a plane glass target image and a mirror image thereof; establish a virtual binocular measurement model; obtain an optimization solution of a rotation matrix and a translation vector from a front coated plane mirror coordinate system to a camera coordinate system by means of a nonlinear optimization method; perform image vanishing point calculation on an alternative feature point by means of least squares; place the white printing paper in front of the front coated plane mirror; the camera simultaneously photographs an actual light bar image and a mirror light bar image; extract center points of the light bar images; and calculate a three-dimensional coordinate of a matching point to solve a light plane equation. By means of the device and the method, the light bar quality is improved and the light bar center extraction precision is raised; feature points with the position precision of the micron order are provided to obtain more calibration points; higher calibration precision is realized; and the calibration result is more stable.
机译:公开了一种基于前涂层平面镜的结构化光参数校准装置,其包括面阵照相机,字线激光器,前涂层平面镜,平面玻璃靶和白色打印纸。还公开了一种基于前涂层平面镜的结构化光参数校准方法,该方法包括:将前涂层平面镜和平面玻璃目标放置在照相机的前面;照相机同时拍摄平面玻璃目标图像及其镜像。建立虚拟的双目测量模型;通过非线性优化方法获得旋转矩阵和平移向量从正面平面镜坐标系到摄像机坐标系的优化解;通过最小二乘法对替代特征点进行图像消失点计算;将白色打印纸放在前涂层平面镜的前面;摄像机同时拍摄实际的光条图像和镜面的光条图像。提取灯条图像的中心点;并计算匹配点的三维坐标来求解光平面方程。通过该装置和方法,提高了灯条质量,提高了灯条中心抽出精度。提供具有微米级位置精度的特征点以获得更多校准点;实现更高的校准精度;校准结果更加稳定。

著录项

  • 公开/公告号WO2018228013A1

    专利类型

  • 公开/公告日2018-12-20

    原文格式PDF

  • 申请/专利权人 BEIHANG UNIVERSITY;

    申请/专利号WO2018CN79922

  • 发明设计人 WEI ZHENZHONG;ZOU WEI;CHAI BINHU;MIN YUE;

    申请日2018-03-22

  • 分类号G01B21/04;

  • 国家 WO

  • 入库时间 2022-08-21 11:57:46

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