首页> 外国专利> MULTI-LAYER THIN FILM STRESS SENSOR FOR NON-DESTRUCTIVE TESTING OF FERROMAGNETIC MATERIALS

MULTI-LAYER THIN FILM STRESS SENSOR FOR NON-DESTRUCTIVE TESTING OF FERROMAGNETIC MATERIALS

机译:铁磁材料的无损检测的多层薄膜应力传感器

摘要

A non-destructive testing technique and sensor are described for measuring surface magnetic permeability and surface stress distribution in ferromagnetic materials. The sensor uses a thin film magnetoresistive sensing element that is either sandwiched between two thin film current conductors and insulators or placed above or below one conductor. Changes in the magnetic permeability of the ferromagnetic material upon which the sensor is placed create an output voltage which is monotonically depending on the magnetic permeability and also on the stress tensor of the ferromagnetic material. Appropriate calibration of the sensor may provide accurate stress distribution measurements, which may be wirelessly transmitted. Surface scanning is also supported by an integrated position sensor.
机译:描述了一种用于测量铁磁材料中的表面磁导率和表面应力分布的无损检测技术和传感器。该传感器使用薄膜磁阻传感元件,该元件要么夹在两个薄膜电流导体和绝缘体之间,要么置于一个导体的上方或下方。放置传感器的铁磁材料的磁导率的变化会产生一个输出电压,该输出电压单调取决于磁导率以及铁磁材料的应力张量。传感器的适当校准可以提供准确的应力分布测量结果,该测量结果可以无线传输。集成的位置传感器也支持表面扫描。

著录项

  • 公开/公告号WO2019018925A1

    专利类型

  • 公开/公告日2019-01-31

    原文格式PDF

  • 申请/专利权人 TSAFARIDIS DEMETRIUS;

    申请/专利号WO2018CA50891

  • 发明设计人 HRISTOFOROU EVANGELOS;

    申请日2018-07-24

  • 分类号G01R33/16;G01L1/12;G01N27/83;

  • 国家 WO

  • 入库时间 2022-08-21 11:57:08

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