首页> 外国专利> SHEAR WAVE OBLIQUE PROBE REFLECTED/DIFFRACTED/DEFORMED WAVE DETECTION METHOD

SHEAR WAVE OBLIQUE PROBE REFLECTED/DIFFRACTED/DEFORMED WAVE DETECTION METHOD

机译:剪切/倾斜/变形的斜波斜波探测方法

摘要

The invention provides a shear wave oblique probe reflected/diffracted/deformed wave detection method. When an ultrasonic shear wave is propagated and encounters a flaw, reflected, diffracted, and deformed waves are generated; comprehensive analysis is performed on these waves, and it is determined, according to reflection features of the reflected waves and diffraction features of the diffracted waves, whether a flaw exists; the shape and size of the flaw is obtained according to a deformed surface wave generated at a flaw end point; by combining propagation paths of the deformed surface wave, the deformed shear wave, the deformed longitudinal wave and the transmitted shear wave generated by the flaw, the causes of all the waves displayed on a screen are revealed, so as to determine a basis for determining an angle or direction of a flaw, thereby accurately positioning flaws, performing quantitative and qualitative analysis, and displaying in three dimensions the actual flaw shape by using A-scan ultrasonic techniques.
机译:本发明提供了一种剪切波斜探头反射/衍射/变形波的检测方法。当超声波剪切波传播并遇到缺陷时,会产生反射,衍射和变形波。对这些波进行综合分析,根据反射波的反射特征和衍射波的衍射特征确定是否存在缺陷。缺陷的形状和大小是根据在缺陷端点处产生的变形表面波获得的。通过结合变形表面波,变形剪切波,纵向变形波和由缺陷产生的透射剪切波的传播路径,揭示屏幕上显示的所有波的产生原因,从而为确定缺陷的角度或方向,从而使用A扫描超声技术准确地定位缺陷,进行定量和定性分析,并在三个维度上显示实际的缺陷形状。

著录项

  • 公开/公告号WO2019029524A1

    专利类型

  • 公开/公告日2019-02-14

    原文格式PDF

  • 申请/专利权人 TEWARE INC.;

    申请/专利号WO2018CN99171

  • 发明设计人 QU SHIFA;

    申请日2018-08-07

  • 分类号G01N29/04;G01N29/24;G01N29/44;

  • 国家 WO

  • 入库时间 2022-08-21 11:56:46

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