FT4222-BASED TESTING SYSTEM AND METHOD FOR SPI FLASH

摘要

Provided are an FT4222-based testing system and method for an SPI flash. The testing method comprises: invoking an FT4222 chip device from debugging tools according to a testing statement inputted by a tester; configuring testing conditions for different parameters for an SPI NAND Flash module; and loading the testing statement to an FT4222 chip module to test the SPI NAND Flash module. The testing method can perform simple tests, such as reading, writing, purging and BurnIn (stability) tests, on an SPI NAND Flash. Moreover, a program code of testing software can be modified to accomplish particular test objectives.