首页> 外国专利> INSPECTION MASTER, INSPECTION MASTER REFERENCE MEMBER, MEASUREMENT TRACEABILITY CONFIRMATION METHOD FOR OPTICAL THREE-DIMENSIONAL MEASURING MACHINE

INSPECTION MASTER, INSPECTION MASTER REFERENCE MEMBER, MEASUREMENT TRACEABILITY CONFIRMATION METHOD FOR OPTICAL THREE-DIMENSIONAL MEASURING MACHINE

机译:光学三维测量机的检查大师,检查大师参考会员,测量可追溯性的确认方法

摘要

The present invention enables accuracy inspection and measurement error calibration of a contact three-dimensional measuring machine and an optical three-dimensional measuring machine to be performed by a single inspection master. This inspection master is provided with: measurement holes with which contactors of a contact three-dimensional measuring machine can contact; and optical indicators for scattering measurement light from an optical measuring machine, wherein the distance between two or more measurement holes and the distance between two or more optical indicators are defined as having a specific distance relation. The distance between two optical indicators of the inspection master is measured by the optical measuring machine, the distance between two measurement holes is measured by the contact three-dimensional measuring machine having measurement traceability, both actually measured distances are compared with each other, and the measurement traceability of the optical measuring machine is confirmed. Detection accuracy of optical indicators is enhanced by providing non-scattering parts around the optical indicators.
机译:本发明使得能够由单个检查主机执行接触式三维测量机和光学三维测量机的精度检查和测量误差校准。该检查主机具有:接触式三维测量机的接触器可以接触的测量孔;以及以及用于散射来自光学测量机的测量光的光学指示器,其中将两个或更多个测量孔之间的距离和两个或更多个光学指示器之间的距离定义为具有特定的距离关系。用光学测量机测量检查主机的两个光学指示器之间的距离,用具有测量可追溯性的接触式三维测量机测量两个测量孔之间的距离,将两个实际测量的距离相互比较,并且确认光学测量机的测量可追溯性。通过在光学指示器周围设置非散射部分,可以提高光学指示器的检测精度。

著录项

  • 公开/公告号WO2019077768A1

    专利类型

  • 公开/公告日2019-04-25

    原文格式PDF

  • 申请/专利权人 ASANUMA GIKEN CO. LTD.;

    申请/专利号WO2018JP03844

  • 发明设计人 ASANUMA SUSUMU;

    申请日2018-02-05

  • 分类号G01B21;

  • 国家 WO

  • 入库时间 2022-08-21 11:55:07

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