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ABNORMALITY INDICATOR DIAGNOSIS DEVICE, ABNORMALITY INDICATOR DIAGNOSIS METHOD, AND ABNORMALITY INDICATOR DIAGNOSIS PROGRAM
ABNORMALITY INDICATOR DIAGNOSIS DEVICE, ABNORMALITY INDICATOR DIAGNOSIS METHOD, AND ABNORMALITY INDICATOR DIAGNOSIS PROGRAM
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机译:异常指示符诊断装置,异常指示符诊断方法和异常指示符诊断程序
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摘要
This abnormality indicator diagnosis device (1) is characterized by comprising: a preprocessing unit (21) that acquires in chronological order a measured value for each of a plurality of parallel processes in which devices of the same type carry out the same type of process, and that counts the acquired measured values of the plurality of parallel processes as a measured value for one process; and a classification unit (22) that classifies the measured value that has been counted as a measured value for one process by the preprocessing unit. More specifically, the preprocessing unit (21) associates each of a plurality of different virtual times included in a prescribed time interval with the measured values for which the actual time at which the measured value was actually acquired is the same, among the measured values respectively acquired from each of the parallel processes, and the classification unit (22) counts the measured values as being acquired at the virtual time.
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