首页> 外国专利> OVERLAPPING PATTERN DIFFERENTIATION AT LOW SIGNAL-TO-NOISE RATIO

OVERLAPPING PATTERN DIFFERENTIATION AT LOW SIGNAL-TO-NOISE RATIO

机译:低信噪比时重叠图形的微分

摘要

Methods and systems for detecting and characterizing a pattern (or patterns) of interest in a low signal-to-noise ratio (SNR) data set are disclosed. One method is a form of a two-stage Likelihood pipeline analysis for differentiating multiple closely-spaced spots that takes advantage of the benefits of a full Likelihood analysis while providing computational tractability. The two-stage pipeline may include a first stage including the application of approximate Likelihood functions. The second stage may include a full Likelihood analysis. Once a pattern of interest instance is characterized, it may be subtracted from the underlying data, and the two-stage analysis may be performed on the reduced data to detect a further pattern of interest proximate the characterized pattern.
机译:公开了用于在低信噪比(SNR)数据集中检测和表征感兴趣的一个或多个模式的方法和系统。一种方法是两阶段似然分析的一种形式,用于区分多个紧密间隔的点,该点利用了完全似然分析的优点,同时提供了计算的可处理性。两阶段流水线可以包括第一阶段,该第一阶段包括近似似然函数的应用。第二阶段可能包括完整的可能性分析。一旦表征了感兴趣的模式实例,就可以从基础数据中减去该实例,并且可以对缩减后的数据执行两阶段分析,以检测接近表征的模式的另一感兴趣的模式。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号