首页> 外国专利> SCHEDULING FOR POWER AMPLIFIER CHARACTERIZATION AND MAXIMUM PERMISSIBLE EXPOSURE MEASUREMENT

SCHEDULING FOR POWER AMPLIFIER CHARACTERIZATION AND MAXIMUM PERMISSIBLE EXPOSURE MEASUREMENT

机译:功率放大器特性描述和最大允许曝光量测量

摘要

Certain aspects of the present disclosure provide systems and methods for performing a power amplifier characterization. One example method generally includes determining, by a user equipment, if a condition associated with a power amplifier characterization is met. In certain aspects, the method includes determining, by the user equipment, a calibration gap after the condition is met. The method also includes performing, by the user equipment, the power amplifier characterization of the one or more power amplifiers of the user equipment during the calibration gap.
机译:本公开的某些方面提供了用于执行功率放大器表征的系统和方法。一种示例方法通常包括由用户设备确定是否满足与功率放大器表征相关联的条件。在某些方面,该方法包括由用户设备在满足条件之后确定校准间隙。该方法还包括由用户设备在校准间隙期间执行用户设备的一个或多个功率放大器的功率放大器表征。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号