首页> 外国专利> SAMPLE SUPPORT STRUCTURE FOR CRYO-ELECTRON MICROSCOPY

SAMPLE SUPPORT STRUCTURE FOR CRYO-ELECTRON MICROSCOPY

机译:低温电子显微镜的样品支持结构

摘要

A sample support structure for electron microscopy includes a membrane having a film, pillars distributed on the film, and a frame supporting the membrane. The pillars may be distributed across an imaging area of the membrane within a periphery defined by the frame. The pillars are distributed on the top side of the membrane and the frame supports the membrane from the bottom side of the membrane. The film may be uniformly thick and planar between the pillars. The film and pillars may be constructed of silicon nitride. The pillars may be uniformly spaced from each other. The pillars may have a uniform first width with respect to a first axis in a plane of the film. The pillars may have a uniform second width with respect to a second axis in the plane of the film. The pillars may have all the same height over the film.
机译:用于电子显微镜的样品支撑结构包括具有膜的膜,分布在该膜上的柱以及支撑该膜的框架。柱可以在由框架限定的外围内跨膜的成像区域分布。支柱分布在膜的顶侧,并且框架从膜的底侧支撑膜。该膜可以在柱之间均匀地厚并且是平坦的。膜和柱可以由氮化硅构成。支柱可以彼此均匀地间隔开。柱相对于膜平面中的第一轴线可具有均匀的第一宽度。柱相对于膜平面中的第二轴线可具有均匀的第二宽度。柱在膜上的高度可以全部相同。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号