首页> 外国专利> AMORPHOUS PHASE QUANTITATIVE ANALYSIS APPARATUS, AMORPHOUS PHASE QUANTITATIVE ANALYSIS METHOD, AND AMORPHOUS PHASE QUANTITATIVE ANALYSIS PROGRAM

AMORPHOUS PHASE QUANTITATIVE ANALYSIS APPARATUS, AMORPHOUS PHASE QUANTITATIVE ANALYSIS METHOD, AND AMORPHOUS PHASE QUANTITATIVE ANALYSIS PROGRAM

机译:非晶相定量分析装置,非晶相定量分析方法和非晶相定量分析程序

摘要

Provided is a quantitative analysis apparatus whereby a sample including a single amorphous phase can be quantitatively analyzed more conveniently. An amorphous phase quantitative analysis apparatus provided with a powder diffraction pattern acquisition means, a qualitative analysis result acquisition means, a fitting function acquisition means for acquiring a fitting function for one or a plurality of crystal phases, a total pattern fitting means executed for the powder diffraction pattern of the sample using the acquired fitting function, and a weight ratio calculation means for calculating a weight ratio of the single amorphous phase and the one or plurality of crystal phases, wherein each fitting function for the one or plurality of crystal phases is any of a first fitting function which uses an integrated intensity obtained by total pattern analysis, a second fitting function which uses an integrated intensity obtained by observation or calculation, or a third fitting function which uses a profile intensity obtained by observation or calculation, and the third fitting function is applied to the single amorphous phase.
机译:本发明提供一种定量分析装置,通过该定量分析装置,可以更简便地定量分析包含单一的非晶相的样品。一种非晶相定量分析设备,其具有粉末衍射图案获取装置,定性分析结果获取装置,用于获取一个或多个晶相的拟合函数的拟合函数获取装置,对粉末执行的总图案拟合装置使用获取的拟合函数的样品的衍射图样,以及用于计算单个非晶相和一个或多个晶体相的重量比的重量比计算装置,其中用于一个或多个晶体相的每个拟合函数是任意的使用通过总模式分析获得的积分强度的第一拟合函数,使用通过观察或计算获得的积分强度的第二拟合函数,或使用通过观察或计算获得的轮廓强度的第三拟合函数,以及第三拟合函数应用于单个非晶相。

著录项

  • 公开/公告号WO2019193818A1

    专利类型

  • 公开/公告日2019-10-10

    原文格式PDF

  • 申请/专利权人 RIGAKU CORPORATION;

    申请/专利号WO2019JP02309

  • 发明设计人 TORAYA HIDEO;MUROYAMA NORIHIRO;

    申请日2019-01-24

  • 分类号G01N23/2055;G01N23/207;

  • 国家 WO

  • 入库时间 2022-08-21 11:52:55

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