IN-SITU TESTING METHOD FOR FORCE-ELECTRICAL COUPLING OF TRANSMISSION ELECTRON MICROSCOPE FOR ONE-DIMENSIONAL MATERIAL

摘要

An in-situ testing method for force-electrical coupling of a transmission electron microscope for one-dimensional material: designing and fabricating a multifunctional sample station capable of compressing, buckling and bending a sample; removing a carbon film of a copper grid of a transmission electron microscope, and cutting same into two halves from the center; ultrasonically dispersing a sample in alcohol; using a pipette to drip the sample at the edge of a semi-circular copper grid; utilizing a micromechanical device for an epoxy resin conductive silver adhesive under an optical microscope to fix a single sample at the edge of a substrate of the sample station, and smearing the surface of the substrate of the sample station using conductive silver paint; and performing in-situ testing for force-electrical coupling in the transmission electron microscope. Provided is a simple and efficient sample preparation and testing method for an in-situ observation experiment for the force-electrical coupling of a transmission electron microscope, which is may perform compressing, buckling and bending experiments on a sample and which is capable of observing in real time changes in the microstructure of material and changes in the electrical performance of the sample during a force-receiving process, thereby achieving in-situ testing for force-electrical coupling of a transmission electron microscope for one-dimensional material.