首页> 外国专利> NUMERICALLY CONTROLLED ROTARY PROBE SWITCHING DEVICE BASED ON ENVIRONMENTALLY CONTROLLABLE ATOMIC FORCE MICROSCOPE

NUMERICALLY CONTROLLED ROTARY PROBE SWITCHING DEVICE BASED ON ENVIRONMENTALLY CONTROLLABLE ATOMIC FORCE MICROSCOPE

机译:基于环境可控原子力显微镜的数控旋转探针切换装置

摘要

Provided is a numerically controlled rotary probe switching device based on an environmentally controllable atomic force microscope. The device comprises an upper cavity cover (1) and a probe switching structure, with the upper cavity cover (1) being provided with an irregular rectangular-like boss (1.1), an inner recess (1.8), a rectangular light window structure and a sealing flange structure. The device has the following advantages: 1) the design of the irregular rectangular-like boss (1.1), the inner recess (1.8), the rectangular light window structure and the sealing flange structure obviously increases the operation space inside a cavity, and effectively improves the space utilization rate; 2) the design of the inner recess (1.8), a connecting structure, i.e. an L-shaped transition plate (10.1), and the asymmetrical cooperation between a probe bracket (10) and a probe carrying block (9) effectively ensure the vertical focusing height and the focusing position of a laser; and 3) the efficient and accurate switching of up to 8 probes (12) with different functions can be realized by means of program control in different operation environments, such as in a vacuum, at an atmosphere and in a liquid, so that the functions, such as surface topography scanning, Raman spectrum analysis, microscopic friction and abrasion and friction coefficient measurement, are realized in situ in the same operation environment.
机译:提供一种基于环境可控原子力显微镜的数控旋转探针开关装置。该装置包括上腔盖(1)和探针切换结构,上腔盖(1)设有不规则的矩形凸起(1.1),内部凹槽(1.8),矩形的光窗结构和密封法兰结构。该装置具有以下优点:1)不规则矩形凸台(1.1),内凹槽(1.8),矩形光窗结构和密封法兰结构的设计明显增加了腔体内的操作空间,有效地提高空间利用率; 2)内部凹槽(1.8)的设计,连接结构(即L形过渡板(10.1))以及探针支架(10)和探针承载块(9)之间的不对称配合有效地确保了垂直激光的聚焦高度和聚焦位置; 3)可以通过程序控制在不同的操作环境中(例如真空,大气和液体中)实现多达8个具有不同功能的探头(12)的高效,准确的切换,因此这些功能如表面形貌扫描,拉曼光谱分析,微观摩擦和磨耗及摩擦系数测量等,是在相同的操作环境中原位实现的。

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