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High sensitivity avalanche photo diode and manufacturing method thereof

机译:高灵敏度雪崩光电二极管及其制造方法

摘要

The present invention relates to a high-sensitive avalanche photo diode improving light receiving sensitivity and a manufacturing method thereof. The high-sensitive avalanche photo diode comprises: first, second, and third epi layers sequentially stacked on a substrate; a focusing layer disposed in a first epi layer and focusing electron in an electron-hole pair formed according to light reception; an acceleration layer disposed in a second epi layer to be in contact with the focusing layer and accelerating the focused electron; a multiplication layer disposed in a third epi layer to be in contact with the acceleration layer and multiplying the accelerated electron; an edge layer annularly disposed on the third epi layer around the multiplication layer to relax electric field crowding of the multiplication layer; and an n+ion implantation layer including upper surfaces of the multiplication layer and the edge layer and disposed on the third epi layer.
机译:本发明涉及一种提高光接收灵敏度的高灵敏度雪崩光电二极管及其制造方法。高灵敏度雪崩光电二极管包括:依次堆叠在基板上的第一,第二和第三外延层;以及第一,第二和第三外延层。聚焦层设置在第一外延层中,并将电子聚焦在根据光接收形成的电子-空穴对中;加速层设置在第二外延层中,以与聚焦层接触并加速聚焦电子;倍增层设置在第三外延层中以与加速层接触并倍增加速的电子;边缘层环形地设置在围绕乘法层的第三外延层上以缓和电场对电场的拥挤。 n +离子注入层,包括倍增层和边缘层的上表面,并设置在第三外延层上。

著录项

  • 公开/公告号KR101927236B1

    专利类型

  • 公开/公告日2018-12-10

    原文格式PDF

  • 申请/专利权人 SIGETRONICS INC.;

    申请/专利号KR20170159953

  • 发明设计人 DEOK HO CHO;KYU HWAN SHIM;SANG SIG CHOI;

    申请日2017-11-28

  • 分类号H01L31/107;H01L31/032;H01L31/18;

  • 国家 KR

  • 入库时间 2022-08-21 11:52:00

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