TEST INTERFACE BOARD HAVING TRANSMISSION LINE TO MERGE SIGNALS TEST SYSTEM USING THE SAME AND TEST SYSTEM

摘要

According to an embodiment of the present invention, a test interface board includes a first input terminal, a second input terminal, an output terminal, and a transmission line. The first input terminal can receive a first test signal to test a semiconductor device. The second input terminal can receive a second test signal to test the semiconductor device. The output terminal can output the first and second test signals through the semiconductor device. The transmission line can electrically connect the first input terminal, the second input terminal, and the output terminal in order to merge the first test signal with the second test signal.