首页> 外国专利> FILTER ARRAY, SPECTROSCOPIC MEASUREMENT ELEMENT INCLUDING FILTER ARRAY, AND SPECTROSCOPE EMPLOYING SPECTROSCOPIC MEASUREMENT ELEMENT

FILTER ARRAY, SPECTROSCOPIC MEASUREMENT ELEMENT INCLUDING FILTER ARRAY, AND SPECTROSCOPE EMPLOYING SPECTROSCOPIC MEASUREMENT ELEMENT

机译:滤镜阵列,包括滤镜阵列的光谱测量元素和使用光谱测量元素的光谱

摘要

Disclosed are a filter array and a spectroscopic measurement element including the filter array, and a spectroscope employing the spectroscopic measurement element. The disclosed filter array can have a multi-array structure including a plurality of filter arrays. The filter array can comprise a first filter array having a plurality of a first filters showing different transmission spectra arrayed, and a second filter array having a plurality of a second filters arrayed in opposition to the first filter array and showing different transmission spectra. A match combination between the plurality of first filters and the plurality of second filters can be changeable. The disclosed spectroscopic measurement element can comprise the filter array having a multi-array structure and a sensor unit for sensing a light transmitted through the filter array.;COPYRIGHT KIPO 2019
机译:公开了一种滤波器阵列和包括该滤波器阵列的光谱测量元件,以及采用该光谱测量元件的光谱仪。所公开的滤波器阵列可以具有包括多个滤波器阵列的多阵列结构。滤光器阵列可以包括具有多个第一滤光器阵列的第一滤光器阵列,第二滤光器阵列具有排列成阵列的不同透射光谱的多个第二滤光器,第二滤光器阵列具有与第一滤光器阵列相对并显示不同透射光谱的多个第二滤光器。多个第一滤波器和多个第二滤波器之间的匹配组合可以改变。所公开的光谱测量元件可以包括具有多阵列结构的滤光器阵列和用于感测通过滤光器阵列透射的光的传感器单元。COPYRIGHTKIPO 2019

著录项

  • 公开/公告号KR20190031027A

    专利类型

  • 公开/公告日2019-03-25

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20170118834

  • 发明设计人 CHO KYUNG SANGKR;

    申请日2017-09-15

  • 分类号G01J3/02;G01J3/12;

  • 国家 KR

  • 入库时间 2022-08-21 11:51:21

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