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Method for determining the geometric parameters and / or material state of an object under investigation by radiography

机译:通过射线照相术确定待测物体的几何参数和/或材料状态的方法

摘要

The invention relates to a method of determining the geometric parameters of an object under investigation by radiography, the object being described mathematically, and the intercepting through the material of the object being irradiated may utilize exposure data of the radiographic image And may be determined from the projection of an object, e.g., a tube, that is imaged by an X-ray or gamma ray source. These intercepts, or intercept curves, that pass through the material of the object allow the object under investigation, e.g., the tube, to have dimensions that are larger than the dimensions of the device (film / detector) used to acquire the radiographic image. During the course of the method, the source of radiation, the object under investigation and the device (film / detector) used to acquire the radiographic image are in a fixed position.
机译:本发明涉及一种确定通过放射线照相法检查的对象的几何参数的方法,该对象被数学地描述,并且通过被照射的对象的材料的拦截可以利用放射线图像的曝光数据,并且可以从放射线图像确定。 X射线或伽马射线源成像的物体(例如管)的投影。穿过物体材料的这些截距或截距曲线允许所研究的物体(例如管)的尺寸大于用于获取放射线图像的设备(胶片/检测器)的尺寸。在该方法过程中,辐射源,正在检查的物体以及用于获取射线照像图像的设备(胶片/检测器)都处于固定位置。

著录项

  • 公开/公告号KR20190031524A

    专利类型

  • 公开/公告日2019-03-26

    原文格式PDF

  • 申请/专利权人 텔레키 피터;

    申请/专利号KR20197004975

  • 发明设计人 텔레키 피터;

    申请日2017-07-27

  • 分类号G01N23/04;G01B15/02;G06T7/12;G06T7/174;

  • 国家 KR

  • 入库时间 2022-08-21 11:51:20

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