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IMAGE PROCESSING DEVICE FOREIGN OBJECT INSPECTION DEVICE IMAGE PROCESSING METHOD AND FOREIGN OBJECT INSPECTION METHOD

机译:图像处理装置异物检查装置图像处理方法及异物检查方法

摘要

The present invention is capable of inspecting foreign material with high precision. The present invention is provided with a background value setting part which is located near a pixel of interest, and in addition, determines a value regarded as a background value on the basis of a first pixel value of at least one reference pixel having a predetermined positional relationship with respect to the pixel of interest, and sets the value as the background value of the pixel of interest.
机译:本发明能够高精度地检查异物。本发明设置有位于关注像素附近的背景值设置部,此外,基于具有预定位置的至少一个参考像素的第一像素值来确定被视为背景值的值。关于关注像素的关系,并将该值设置为关注像素的背景值。

著录项

  • 公开/公告号KR20190114881A

    专利类型

  • 公开/公告日2019-10-10

    原文格式PDF

  • 申请/专利权人 SUMITOMO CHEMICAL CO. LTD.;

    申请/专利号KR20190036656

  • 发明设计人 KASHU KOJI;

    申请日2019-03-29

  • 分类号G01N23/04;G01N21/892;G06T7;

  • 国家 KR

  • 入库时间 2022-08-21 11:49:37

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