首页> 外国专利> A System for Analyzing Components Based on an Absorption Ratio of X-ray and the Method for Analysing Components by the System

A System for Analyzing Components Based on an Absorption Ratio of X-ray and the Method for Analysing Components by the System

机译:基于X射线吸收率的成分分析系统及系统的成分分析方法

摘要

The present invention relates to a component analysis system based on X-ray absorption characteristics and a method for analyzing components thereof, and more specifically, to an X-ray absorption property analyzing component content based on different X-ray absorption characteristics in a high- And a method for analyzing components by the system. A component analysis system based on X-ray absorption characteristics and a component analysis method thereof are formed in a conveyance path of an object to be inspected, and have an inspection region in which an X-ray tube and a detector are arranged; A low energy detection region and a high energy detection region formed in the detector; And an analysis module that calculates the content of the component included in the inspection target from the image detected in the detection area through the inspection target in the inspection area.
机译:基于X射线吸收特性的成分分析系统及其成分分析方法技术领域本发明涉及一种基于X射线吸收特性的成分分析系统及其成分分析方法,更具体地,涉及一种基于高X射线吸收特性的X射线吸收特性分析成分含量。以及由系统分析组件的方法。在被检查物的输送路径上形成有基于X射线吸收特性的成分分析系统及其成分分析方法,并具有配置有X射线管和检测器的检查区域。检测器中形成有低能量检测区域和高能量检测区域;以及分析模块,其根据在检测区域中检测到的图像到检查区域中的检查目标来计算检查目标中包括的成分的含量。

著录项

  • 公开/公告号KR101947373B1

    专利类型

  • 公开/公告日2019-04-29

    原文格式PDF

  • 申请/专利权人 (주)자비스;

    申请/专利号KR20170077190

  • 发明设计人 김형철;김형재;류덕현;박재성;

    申请日2017-06-19

  • 分类号G01N23/087;G01N23/16;G01N23/18;

  • 国家 KR

  • 入库时间 2022-08-21 11:49:11

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