首页> 外国专利> Calibration method and apparatus for broadband achromatic aberration composite wave plate and corresponding measuring system

Calibration method and apparatus for broadband achromatic aberration composite wave plate and corresponding measuring system

机译:宽带消色差像差复合波片的校准方法,装置及相应的测量系统

摘要

The present invention discloses a calibration method and apparatus for composite wave plates 2 and 3 and corresponding measurement systems. The calibration method comprises the steps of: A. determining a first matrix comprising at least one unknown, specifying the composite wave plate (2, 3); B. determining, based on the first matrix, a relationship between the theoretical light intensity and the alignment angle deviation value of the composite wave plate (2, 3); C. The composite wavelength plate (by adjusting according to the relationship between the theoretical light intensity already determined in step (B) and the alignment angle deviation value of the composite wavelength plate 2, 3 and the light intensity data obtained by the actual measurement) Obtaining a second matrix capable of specifying 2, 3) and not including an unknown. According to the technical scheme of the present invention, when performing calibration on the composite waveplates 2 and 3 or the measurement system, the number of unknowns can be greatly reduced, thus reducing the difficulty of calibration and improving the accuracy of calibration. .
机译:本发明公开了一种用于复合波片2和3以及相应的测量系统的校准方法和设备。校准方法包括以下步骤:A.确定包括至少一个未知数的第一矩阵,指定复合波片(2、3); B.基于第一矩阵,确定理论光强度与复合波片(2、3)的取向角偏差值之间的关系; C.复合波片(根据步骤(B)中已经确定的理论光强度与复合波片2、3的取向角偏差值和通过实际测量获得的光强度数据之间的关系进行调整)获得能够指定2、3)并且不包括未知数的第二矩阵。根据本发明的技术方案,在对复合波片2和3或测量系统进行校准时,可以大大减少未知数,从而降低了校准难度,提高了校准精度。 。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号