首页> 外国专利> SPECTRAL CHARACTERISTIC MEASUREMENT APPARATUS AND SPECTRAL CHARACTERISTIC MEASUREMENT METHOD

SPECTRAL CHARACTERISTIC MEASUREMENT APPARATUS AND SPECTRAL CHARACTERISTIC MEASUREMENT METHOD

机译:光谱特征测量装置和光谱特征测量方法

摘要

An apparatus for measuring spectroscopic characteristics of the present invention includes a spectroscope for spatially dispersing incident light according to a wavelength, and a detector 25 for receiving light dispersed by a spectroscope. The detection unit 25 includes a first detection region 25a in which a component of a first wavelength range is incident and a second detection region 25b in which a component of a second wavelength range that is longer than the first wavelength range is incident. . The spectroscopic characteristic measuring apparatus includes a correcting section that corrects stray light generated in the detecting section by the light to be measured. The correction unit 100 adjusts the stray light pattern based on the first change amount relating to the wavelength in the first wavelength range of the stray light pattern and the second change amount relating to the wavelength included in the result detected in the first detection region of the detection unit. By correcting, the stray light component generated by the light to be measured is calculated.
机译:本发明的用于测量光谱特性的设备包括:光谱仪,用于根据波长在空间上散射入射光;以及检测器25,用于接收由光谱仪散射的光。检测单元25包括其中入射第一波长范围的分量的第一检测区域25a和其中入射比第一波长范围长的第二波长范围的分量的第二检测区域25b。 。光谱特性测量设备包括校正部分,该校正部分通过要测量的光校正在检测部分中产生的杂散光。校正单元100基于与杂散光图案的第一波长范围内的波长有关的第一改变量和与在杂散光图案的第一检测区域中检测到的结果中包括的波长有关的第二改变量来调整杂散光图案。检测单元。通过校正,计算由待测光产生的杂散光分量。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号