SPECTRAL CHARACTERISTIC MEASUREMENT APPARATUS AND SPECTRAL CHARACTERISTIC MEASUREMENT METHOD
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机译:光谱特征测量装置和光谱特征测量方法
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摘要
An apparatus for measuring spectroscopic characteristics of the present invention includes a spectroscope for spatially dispersing incident light according to a wavelength, and a detector 25 for receiving light dispersed by a spectroscope. The detection unit 25 includes a first detection region 25a in which a component of a first wavelength range is incident and a second detection region 25b in which a component of a second wavelength range that is longer than the first wavelength range is incident. . The spectroscopic characteristic measuring apparatus includes a correcting section that corrects stray light generated in the detecting section by the light to be measured. The correction unit 100 adjusts the stray light pattern based on the first change amount relating to the wavelength in the first wavelength range of the stray light pattern and the second change amount relating to the wavelength included in the result detected in the first detection region of the detection unit. By correcting, the stray light component generated by the light to be measured is calculated.
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