首页> 外国专利> TEST CONNECTOR MANUFACTURING METHOD OF THE TEST CONNECTOR AND TESTING METHOD OF DEVICE-UNDER-TEST USING THE TEST CONNECTOR

TEST CONNECTOR MANUFACTURING METHOD OF THE TEST CONNECTOR AND TESTING METHOD OF DEVICE-UNDER-TEST USING THE TEST CONNECTOR

机译:测试连接器的测试连接器制造方法以及使用该测试连接器的设备-内部测试的测试方法

摘要

According to the disclosed embodiment, provided is a test connector on XYZ orthogonal coordinates, which comprises: a sheet of an insulating material; and a plurality of conductive units of a conductive material extending in the Z-axis direction, spaced from each other in the X-axis direction, disposed on the sheet, and having both ends of the Z-axis direction being exposed on the surface of the sheet. The plurality of conductive units are formed by etching the plurality of support units in a state of being intertwined with a plurality of support units extending in the X-axis direction and spaced apart from each other in the Z-axis direction.
机译:根据公开的实施例,提供了一种在XYZ正交坐标上的测试连接器,其包括:一片绝缘材料;和多个导电材料的导电单元,其在Z轴方向上延伸,并在X轴方向上彼此间隔开,并设置在片材上,并且Z轴方向的两端暴露在金属薄片的表面上。工作表。通过在与在X轴方向上延伸并且在Z轴方向上彼此间隔开的多个支撑单元缠绕在一起的状态下蚀刻多个支撑单元来形成多个导电单元。

著录项

  • 公开/公告号KR102030586B1

    专利类型

  • 公开/公告日2019-10-10

    原文格式PDF

  • 申请/专利权人 ISC CO. LTD.;

    申请/专利号KR20180070975

  • 发明设计人 CHUNG YOUNG BAE;

    申请日2018-06-20

  • 分类号G01R3;G01R1/04;G01R1/073;G01R31/28;

  • 国家 KR

  • 入库时间 2022-08-21 11:47:36

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