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A method of obtaining a given configuration of film resistors based on tantalum and its compounds

机译:一种基于钽及其化合物获得给定配置的薄膜电阻器的方法

摘要

FIELD: physics.SUBSTANCE: invention relates to electronics and can be used to produce thin-film resistors based on tantalum and compounds thereof. Result is achieved by the fact that the method of obtaining a given configuration of film resistors based on tantalum and compounds thereof comprises applying on a resistive film of tantalum and compounds thereof a film of yttrium and forming the configuration using photolithography and selective chemical etching of a film of yttrium and a film of tantalum and compounds thereof, wherein the yttrium film thickness is 0.05–0.1 mcm, and selective chemical etching of resistive films of tantalum and compounds thereof is carried out in solutions based on hydrofluoric acid, and selective chemical etching of yttrium film is carried out in a solution of orthophosphoric acid.EFFECT: technical result is obtaining a given configuration of film resistors based on tantalum and compounds thereof without undercutting across the resistor width.1 cl
机译:技术领域本发明涉及电子学,并且可以用于生产基于钽及其化合物的薄膜电阻器。通过获得基于钽及其化合物的薄膜电阻器的给定配置的方法,可以得到结果,该方法包括在钽及其化合物的电阻膜上涂覆钇膜,并通过光刻和选择性化学刻蚀形成该配置。钇膜和钽膜及其化合物,其中钇膜厚度为0.05-0.1 mcm,并且在基于氢氟酸的溶液中对钽及其化合物的电阻膜进行选择性化学刻蚀,然后对钇膜在正磷酸溶液中进行。效果:技术成果是在不削弱电阻宽度的前提下,获得了基于钽及其化合物的给定薄膜电阻器配置。

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