METHOD FOR NON-DESTRUCTIVE QUALITY CONTROL OF NEAR-SURFACE LAYER OF OPTICAL MATERIALS

摘要

FIELD: instrument engineering.;SUBSTANCE: invention relates to production of high-quality optical devices, in particular to quality control of processed surfaces of optical materials, both amorphous and monocrystalline. Disclosed is a method for real-time non-destructive quality control of near-surface layer of optical materials without using complex measurement equipment, consisting in the fact that the quality of the surface layer of the monitored surface is evaluated by measuring the angular dependence of the reflection coefficient of the plane-polarized monochromatic beam from the surface of the analyzed sample near the Brewster angle for the given material and comparing the measured dependence of the reflection coefficient with the relationship for the reference sample (reference) or with the calculated relationship for the ideal surface from the position of the minimum reflection coefficient and the corresponding angle.;EFFECT: optimization of processing time, increase of output and quality of the products.;1 cl, 1 tbl, 3 dwg