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A method of forming a metallic interconnect, method of making a semiconductor interconnect having a metallic interconnect, and a semiconductor interconnect semiconductor device array

机译:形成金属互连的方法,制造具有金属互连的半导体互连的方法以及半导体互连半导体器件阵列

摘要

A metallic interconnect and a semiconductor device containing the same, wherein a method of making the same may include: providing a first structure including a first metallic layer having protruding first microstructures; Providing a second structure including a second metallic layer having protruding second microstructures; Contacting the first and second microstructures to form a mechanical connection between the structures, wherein the mechanical connection is configured to allow the penetration of a fluid; Removing one or more non-metallic compounds on the first metallic layer and the second metallic layer with a reducing agent which penetrates the mechanical compound and reacts with the one or more non-metallic compounds; and heating the first metallic layer and the second metallic layer to a temperature causing interdiffusion of the first metallic layer and the second metallic layer to form the metallic interconnect between the structures.
机译:一种金属互连件和包含该金属互连件的半导体器件,其中制造该金属互连件的方法可以包括:提供第一结构,该第一结构包括具有突出的第一微结构的第一金属层;提供第二结构,其包括具有突出的第二微结构的第二金属层;使第一微结构和第二微结构接触以在结构之间形成机械连接,其中机械连接被构造成允许流体渗透。用还原剂去除第一金属层和第二金属层上的一种或多种非金属化合物,该还原剂渗透机械化合物并与一种或多种非金属化合物反应;将第一金属层和第二金属层加热到引起第一金属层和第二金属层相互扩散以形成结构之间的金属互连的温度。

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