Method and apparatus for generating a two-dimensional interferogram with a Michelson-type free-jet design

摘要

The invention relates to a method for producing a two-dimensional interferogram with a Michelson-type free-jet interferometer comprising an extended, spatially partially coherent light source and a two-dimensional light detector, wherein light from the light source is split by a beam splitter having a semitransparent beam splitter mirror into a sample light beam and a reference light beam and a sample arm and a reference arm, the specimen light beam recurring from a sample being directed onto the light detector via the beam splitter mirror, the reference light beam exiting the reference arm subtending a predetermined angle greater than zero with the sample light beam on the light detector, the length of the specimen Referenzarms is variable, characterized in that the reference light beam by means of an odd number of reflections in each reflection plane in at least one Referenzarmabschnitt is laterally offset to the side and opposite parallel running through a fixed at the output of the reference arm arranged, deflected by diffraction or refraction light deflecting element.