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New sample sets and new down-sampling schemes for linear component sample prediction

机译:用于线性分量样本预测的新样本集和新的下采样方案

摘要

Deriving a linear model for obtaining a sample for a block of a first image component from an associated sample of a second-component block in the same frame comprises determining 1003 two points A, B based on reconstructed samples of both the first-component and the second-component. Each point is defined by two variables, the first variable corresponding to a second-component sample value, the second variable corresponding to a first-component sample value. Parameters of a linear equation representing a straight line passing by the two points are determined 1005 and the linear model defined by the straight-line parameters is derived 1006. Determining the parameters uses integer arithmetic. The method may be used in calculating parameters in cross-component linear mode (CCLM) prediction of luma or chroma values during image compression. The points may be determined based on sample values of pairs of first component and second component blocks neighboring the second component block. A parameter α may correspond to a line’s slope and parameter α may be estimated by calculating a difference between the first components of the points, the size of the difference being restricted by applying a bit shift to it. The bit-shift may depend on a sample bit depth.
机译:从同一帧中的第二分量块的相关样本中获得用于获取第一图像分量块的样本的线性模型包括:基于第一分量和第二分量的重构样本,确定1003两个点A,B。第二部分。每个点由两个变量定义,第一个变量对应于第二分量样本值,第二个变量对应于第一分量样本值。确定表示经过两点的直线的线性方程式的参数1005,并推导由该直线参数定义的线性模型1006。确定参数使用整数算法。该方法可以用于在图像压缩期间在亮度或色度值的跨分量线性模式(CCLM)预测中计算参数。可以基于与第二分量块相邻的第一分量块和第二分量块对的采样值来确定点。参数α可以对应于直线的斜率,并且参数α可以通过计算点的第一分量之间的差来估计,该差的大小通过对其进行位移来限制。移位可以取决于样本比特深度。

著录项

  • 公开/公告号GB201820023D0

    专利类型

  • 公开/公告日2019-01-23

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号GB20180020023

  • 发明设计人

    申请日2018-12-07

  • 分类号

  • 国家 GB

  • 入库时间 2022-08-21 11:43:36

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