首页> 外国专利> SUB-SURFACE PATTERNING FOR DIFFRACTION-BASED STRAIN MEASUREMENT AND DAMAGE DETECTION IN STRUCTURES

SUB-SURFACE PATTERNING FOR DIFFRACTION-BASED STRAIN MEASUREMENT AND DAMAGE DETECTION IN STRUCTURES

机译:结构中基于衍射的应变测量和损伤检测的子表面打标

摘要

Systems and methods for assessing strain in structural components are disclosed. Structural components may have geometric patterns of grooves within the structural component, with the grooves in the geometric pattern each having a groove width. The method may include projecting beams of electromagnetic (EM) energy through the structural component to the geometric pattern of grooves to create diffracted beams of EM energy that are reflected from or transmitted through the geometric pattern of grooves and have diffracted wavelengths indicating changes in the groove widths due to strain caused when the structural component is exposed to environmental conditions, detecting the diffracted wavelength of the diffracted beams, and correlating the diffracted wavelengths of the diffracted beams to the strain in the structural components.
机译:公开了用于评估结构部件中的应变的系统和方法。结构部件可在结构部件内具有凹槽的几何图案,其中几何图案中的凹槽均具有凹槽宽度。该方法可以包括将电磁(EM)能量束穿过结构部件投射到凹槽的几何图案以产生从凹槽的几何图案反射或透射通过凹槽的几何图案并且具有指示凹槽变化的衍射波长的EM能量的衍射束。当结构部件暴露于环境条件时由于应变引起的宽度,检测衍射光束的衍射波长,并使衍射光束的衍射波长与结构部件中的应变相关。

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