首页>
外国专利>
METHOD FOR MEASURING SPECTRAL RADIATION CHARACTERISTICS OF FLUORESCENCE WHITENED SAMPLE, AND DEVICE FOR MEASURING SPECTRAL RADIATION CHARACTERISTICS OF FLUORESCENCE WHITENED SAMPLE
METHOD FOR MEASURING SPECTRAL RADIATION CHARACTERISTICS OF FLUORESCENCE WHITENED SAMPLE, AND DEVICE FOR MEASURING SPECTRAL RADIATION CHARACTERISTICS OF FLUORESCENCE WHITENED SAMPLE
An approximation Bf(Id, λ) of a fluorescence spectral emissivity coefficient by a standard illumination light Id is obtained at following steps from spectral power distributions R(Ik,λ) of sample radiation lights radiated from a fluorescence whitened sample when the fluorescence whitened sample is sequentially illuminated with a plurality of excitation lights Ik having different spectral power distributions, and a spectral power distribution Id(λ) of the standard illumination light Id. Spectral power distributions Rf(Ik,λ) of fluorescence are obtained from the spectral power distributions R(Ik,λ) by respective excitation lights Ik (first step). The spectral power distributions Rf(Ik,λ) of fluorescence by the respective excitation lights Ik are linearly combined with a given weighting coefficient Wk, and an approximation Rf(Id, λ) of a spectral power distribution of fluorescence by the standard illumination light Id is obtained by equation (second step: #11). From the approximation Rf(Id, λ) and the spectral power distribution Id(λ) of the standard illumination light Id, the approximation Bf(Id, λ) is obtained by equation (third step: #12).
展开▼