首页> 外国专利> ANECHOIC TEST CHAMBER, TEST SYSTEM AND TEST METHOD FOR TESTING THE ANTENNAS OF A DEVICE UNDER TEST

ANECHOIC TEST CHAMBER, TEST SYSTEM AND TEST METHOD FOR TESTING THE ANTENNAS OF A DEVICE UNDER TEST

机译:用于测试设备天线的无声测试室,测试系统和测试方法

摘要

This application relates to an anechoic test chamber for testing antennas of a device under test (DUT), the test chamber comprising: a test area having a test surface for receiving the DUT, wherein in a test mode the test surface forms a region of measurement of the DUT and wherein the DUT comprises at least one antenna array having a plurality of multi-input multi-output (MIMO) antennas, at least one reflector compact antenna test range (CATR) comprising a first measurement antenna and one shaped reflector, wherein the reflector is used to generate a first quiet zone, at least one second measurement antenna, wherein the second measurement antenna is arranged inside the test chamber such to generate a second quiet zone at test surface, an input/output terminal for connecting the test chamber to a test equipment, wherein the input/output terminal is connected to the first and second antennas.
机译:本申请涉及一种用于测试被测设备(DUT)的天线的消声测试室,该测试室包括:具有用于接收该DUT的测试表面的测试区域,其中,在测试模式下,该测试表面形成测量区域。 DUT,其中DUT包括至少一个具有多个多输入多输出(MIMO)天线的天线阵列,至少一个反射器紧凑型天线测试范围(CATR)包括第一测量天线和一个成形的反射器,其中反射器用于产生第一静区,至少一个第二测量天线,其中第二测量天线布置在测试室内,以在测试表面处产生第二静区,用于连接测试室的输入/输出端子。测试设备,其中输入/输出端子连接到第一和第二天线。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号