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Temperature measuring device using induced fluorescence method and temperature measuring method using induced fluorescence method

机译:利用感应荧光法的温度测量装置以及利用感应荧光法的温度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a temperature measuring device using an induced fluorescence method, which can improve the degree of freedom of arrangement of an imaging device and expand the range of temperature measurement targets. SOLUTION: A fluorescent material 8 coated or adhered to a temperature measurement object 7 is irradiated with input light having a predetermined wavelength, and the temperature of the temperature measurement object 7 is measured based on the brightness of fluorescence induced by the input light. A temperature measuring device 1 using an induced fluorescence method. The measuring tank 2 is filled with the fluid 6 mixed with the tracer particles 9 having a surface capable of reflecting the fluorescence, and the temperature measuring object 7 is housed, and the input light having a predetermined wavelength is the temperature measuring target. A light source 3 that irradiates the fluorescent material 8 coated or adhered to the object 7, and an imaging device 4 that captures the scattered fluorescence in which the fluorescence emitted from the fluorescent material 8 by the irradiation of the input light is scattered by the tracer particles 9. A processing device 5 for obtaining the temperature of the temperature measurement object based on the brightness of the scattered fluorescence imaged by the image pickup device 4 is provided. [Selection diagram] Fig. 1
机译:解决的问题:提供一种使用诱导荧光法的温度测量装置,其可以提高成像装置的布置自由度并扩大温度测量目标的范围。解决方案:用预定波长的输入光照射涂在或粘附到温度测量对象7上的荧光材料8,并根据输入光感应的荧光亮度测量温度测量对象7的温度。使用诱导荧光法的温度测量装置1。在测定槽2中填充有与具有能够反射荧光的表面的示踪粒子9混合的流体6,并收容有温度测定对象物7,将规定波长的输入光作为温度测定对象。光源3照射被涂覆或粘附到物体7上的荧光材料8,并且成像装置4捕获散射的荧光,其中通过输入光的照射从荧光材料8发射的荧光被示踪剂散射。粒子9。设有处理装置5,该处理装置5用于基于由摄像装置4拍摄的散射荧光的亮度求出测温对象物的温度。 [选择图]图1

著录项

  • 公开/公告号JP2020148710A

    专利类型

  • 公开/公告日2020-09-17

    原文格式PDF

  • 申请/专利权人 株式会社ジェイテクト;

    申请/专利号JP20190048304

  • 发明设计人 大瀧 善弘;

    申请日2019-03-15

  • 分类号G01K11/32;

  • 国家 JP

  • 入库时间 2022-08-21 11:37:27

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